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Fundamentals of atomic force microscopy: Part I: foundations

By: Material type: TextTextSeries: Lessons from Nanoscience: A lecure note series. ; no. 4 Publication details: Singapore: World Scientific, 2016Description: xv, 324pISBN:
  • 9789814630344
Subject(s): DDC classification:
  • 502.82 REI
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Holdings
Item type Home library Collection Call number Materials specified Status Date due Barcode Item holds
Reference Books Reference Books Central LIBRARY R3-1F REFERENCE SECTION Mechanical engineering 502.82 REI (Browse shelf(Opens below)) Reference Books (Not For Loan) DD42918
Total holds: 0
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502.82 REI Fundamentals of atomic force microscopy: Part I: foundations 515.35 LAK Finite element analysis: procedures in engineering 515.62 DIX Finite Element Methods for Engineers 620.11282 TIM Theory of plates and shells

Includes index

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