Normal view MARC view ISBD view

Fundamentals of atomic force microscopy: Part I: foundations

Reifenberger, Ronald G.

Fundamentals of atomic force microscopy: Part I: foundations - Singapore: World Scientific, 2016 - xv, 324p. - Lessons from Nanoscience: A lecure note series ; no. 4 .

Includes index

ISBN: 9789814630344

Subjects--Topical Terms:
Nano Science
Microscopy
Atomic Force Microscopy

Dewey Class. No.: 502.82 / REI

Print
Add to your cart (remove)
Save record
ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)