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020 _a9788172248918
040 _aUPES LIBRARY
_bEnglish
082 _a621.381
_bABR
100 _aAbramovici, Miron
_935
245 _aDigital systems testing and testable design
260 _aNew Delhi:
_bJaico.
_c2007
300 _a652p.
650 _aElectronics
_943180
700 _aBreuer, Melvin
_91055
700 _aFriedman, Arthur
_916860
942 _cBK