| 000 | nam a22 7a 4500 | ||
|---|---|---|---|
| 999 |
_c31162 _d31162 |
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| 005 | 20170501122436.0 | ||
| 008 | 170501b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9789814630344 | ||
| 040 |
_aUPES LIBRARY _bEnglish |
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| 082 |
_a502.82 _bREI |
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| 100 |
_aReifenberger, Ronald G. _951353 |
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| 245 | _aFundamentals of atomic force microscopy: Part I: foundations | ||
| 260 |
_aSingapore: _bWorld Scientific, _c2016 |
||
| 300 | _axv, 324p. | ||
| 440 |
_aLessons from Nanoscience: A lecure note series _n; no. 4 _951356 |
||
| 500 | _aIncludes index | ||
| 650 |
_aNano Science _917825 |
||
| 650 |
_aMicroscopy _951354 |
||
| 650 |
_aAtomic Force Microscopy _951355 |
||
| 942 | _cREF | ||