000 00493nam a2200169Ia 4500
999 _c136564
_d136564
005 20180411103327.0
008 180316s9999||||xx |||||||||||||| ||und||
020 _a9788132214403
040 _aUPES LIBRARY
_bEnglish
082 _a621.381
_bNAV
100 _aNavabi, Zainalabedin
_964047
245 0 _aDigital system test and testable design: using HDL models and architectures
260 _aUSA:
_bSpringer,
_c2011
300 _axxii, 434p.
650 _aElectronics
_964048
942 _cREF